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This novel programmable light-source emulates a single line of a matrix-organized electronic visual display with an exactly controlled timing. It is designed for performance checking and calibration of measurement devices for motion-blur analysis and for research of perception of motion by the human visual system. The complete range of display screens from hold-type to impulse-type display can be emulated.

Michael E. Becker receives IEC-1906 Award 2006

Created in 2004 by the IEC Executive Committee (ExCo), the IEC 1906 Award was established in commemoration of the IEC’s year of foundation and honours IEC technical experts around the world whose work is fundamental to the IEC. The award also recognizes exceptional and recent achievement - a project or other specific contribution - related to the activities of the IEC and which contributes in a significant way to advancing the work of the Commission (see list of relevant publications).

ISO 9241-300 accepted by voting

The elective P-member countries decided end of June 2006 to accept the revised version of ISO 13406-2 which is ISO 9241-300. Extending the range of ISO 13406-2 the new standard takes care of all types of electronic displays (CRTs, LCDs, PDPs, projection displays, etc.) and of all applications, not restricted to office work but including entertainment, etc.

High-resolution BSDF/BRDF-measurement and evaluation finally made affordable !

DM&S has introduced a novel approach on the SID 2004 Conference in Seattle for measurement and evaluation of display scattering. The BSDF-Meter, the implementation of this method, is now available from DM&S for simple and effective measurement and evaluation of light scattering in general (bidirectional scattering distribution function, BSDF) and for application to electronic displays specifically.

A reprint of the conference paper is available here. More publications on the subject can be found here.

The method is based on the measurement of the lateral distribution of reflected luminance with an imaging detector. After numerical transformation of the measured luminance distribution we obtain the characteristics of the BRDF/BSDF of the sample with high directional resolution within a limited range of inclination angles centered about the specular direction. Due to the absence of moving parts the method exhibits only little sensitivity with respect to variations of the geometry parameters and is thus very robust.